Open Compression Interface Technical Commitee

Background

On-chip scan compression techniques are used to reduce the cost of test. Current on-chip scan compression methods use proprietary solutions that lock users into specific tools and flows for test logic insertion, test logic verification, test pattern generation, and diagnosis. Being locked into a specific tool and flow limits competition, which is bad for the test industry. This situation is particularly restrictive when multiple foundries are used for a design and the foundries support different compression solutions.

Group Objectives

The purpose of this project is to develop an Open scan Compression Interface (OCI) to describe on-chip scan compression structures to EDA tools. This description will enable EDA vendors to support pattern generation and diagnosis for multiple on-chip scan compression structures. The description will:

• Only reveal as much of hardware implementation as necessary for pattern generation and diagnosis
• Not limit the ability of EDA companies to innovate and develop their own compression solutions
• Support most types of structures for input and output compression
  

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